Development of A Testing Methodology to Predict Optical Disk Life Expectancy Values

Development of A Testing Methodology to Predict Optical Disk Life Expectancy Values

Printed Ephemera - 1991
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Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1991
Branch Call Number: C 13.10:500-200
Characteristics: xv, 84 p. : ill. ; 28 cm

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