The Certification of 100 Mm Diameter Silicon Resistivity SRMs 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements

The Certification of 100 Mm Diameter Silicon Resistivity SRMs 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements

Printed Ephemera - 1997
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Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997
Branch Call Number: C 13.10:260-131
Characteristics: xv, 84 p. : ill. ; 28 cm

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