Antireflecting-chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems

Antireflecting-chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring Systems

Standard Reference Materials

Printed Ephemera - 1992
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Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service, 1992]
Branch Call Number: C 13.10:260-119
Characteristics: 1 v

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